BibTeX record conf/irps/GuptaJSSRS19

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@inproceedings{DBLP:conf/irps/GuptaJSSRS19,
  author       = {Sayak Dutta Gupta and
                  Vipin Joshi and
                  Bhawani Shankar and
                  Swati Shikha and
                  Srinivasan Raghavan and
                  Mayank Shrivastava},
  title        = {UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs
                  and Their Role in Threshold Voltage {\&} Gate Leakage Instabilities},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720595},
  doi          = {10.1109/IRPS.2019.8720595},
  timestamp    = {Sat, 30 Sep 2023 09:49:38 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/GuptaJSSRS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}