BibTeX record conf/irps/GuptaBSBPBAC21

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@inproceedings{DBLP:conf/irps/GuptaBSBPBAC21,
  author       = {Aniket Gupta and
                  Govind Bajpai and
                  Priyanshi Singhal and
                  Navjeet Bagga and
                  Om Prakash and
                  Shashank Banchhor and
                  Hussam Amrouch and
                  Nitanshu Chauhan},
  title        = {Traps Based Reliability Barrier on Performance and Revealing Early
                  Ageing in Negative Capacitance {FET}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405185},
  doi          = {10.1109/IRPS46558.2021.9405185},
  timestamp    = {Wed, 07 Dec 2022 23:06:42 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/GuptaBSBPBAC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}