BibTeX record conf/irps/GonzalezMCAJR20

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@inproceedings{DBLP:conf/irps/GonzalezMCAJR20,
  author       = {Mireia Bargallo Gonz{\'{a}}lez and
                  Marcos Maestro{-}Izquierdo and
                  Francesca Campabadal and
                  Samuel Aldana and
                  Francisco Jim{\'{e}}nez{-}Molinos and
                  Juan Bautista Rold{\'{a}}n},
  title        = {Impact of Intrinsic Series Resistance on the Reversible Dielectric
                  Breakdown Kinetics in HfO2 Memristors},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128961},
  doi          = {10.1109/IRPS45951.2020.9128961},
  timestamp    = {Thu, 14 Oct 2021 10:37:08 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/GonzalezMCAJR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}