BibTeX record conf/irps/GarbaSeybouFMSCHB23

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@inproceedings{DBLP:conf/irps/GarbaSeybouFMSCHB23,
  author       = {Tidjani Garba{-}Seybou and
                  Xavier Federspiel and
                  Frederic Monsieur and
                  Mathieu Sicre and
                  Florian Cacho and
                  Joycelyn Hai and
                  Alain Bravaix},
  title        = {Location of Oxide Breakdown Events under Off-state {TDDB} in 28nm
                  N-MOSFETs dedicated to {RF} applications},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117725},
  doi          = {10.1109/IRPS48203.2023.10117725},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/GarbaSeybouFMSCHB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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