BibTeX record conf/irps/FiorenzaAABCMRS21

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@inproceedings{DBLP:conf/irps/FiorenzaAABCMRS21,
  author       = {Patrick Fiorenza and
                  Salvatore Adamo and
                  Mario Santo Alessandrino and
                  Cettina Bottari and
                  Beatrice Carbone and
                  Clarice Di Martino and
                  Alfio Russo and
                  Mario Saggio and
                  Carlo Venuto and
                  Elisa Vitanza and
                  Edoardo Zanetti and
                  Filippo Giannazzo and
                  Fabrizio Roccaforte},
  title        = {Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405148},
  doi          = {10.1109/IRPS46558.2021.9405148},
  timestamp    = {Thu, 20 May 2021 08:27:16 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FiorenzaAABCMRS21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}