BibTeX record conf/irps/FeeleyXBNWF21

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@inproceedings{DBLP:conf/irps/FeeleyXBNWF21,
  author       = {Alexandra Feeley and
                  Yoni Xiong and
                  Bharat L. Bhuva and
                  Balaji Narasimham and
                  Shi{-}Ji Wen and
                  Rita Fung},
  title        = {Effects of Temperature and Supply Voltage on Soft Errors for 7-nm
                  Bulk FinFET Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405124},
  doi          = {10.1109/IRPS46558.2021.9405124},
  timestamp    = {Thu, 20 May 2021 08:27:17 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FeeleyXBNWF21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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