BibTeX record conf/irps/FaveroCSBFGBDMZM23

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@inproceedings{DBLP:conf/irps/FaveroCSBFGBDMZM23,
  author       = {Davide Favero and
                  A. Cavaliere and
                  Carlo De Santi and
                  Matteo Borga and
                  W. Gon{\c{c}}alez Filho and
                  Karen Geens and
                  Benoit Bakeroot and
                  Stefaan Decoutere and
                  Gaudenzio Meneghesso and
                  Enrico Zanoni and
                  Matteo Meneghini},
  title        = {High- Temperature {PBTI} in Trench-Gate Vertical GaN Power MOSFETs:
                  Role of Border and Semiconductor Traps},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117667},
  doi          = {10.1109/IRPS48203.2023.10117667},
  timestamp    = {Sun, 04 Aug 2024 19:36:36 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FaveroCSBFGBDMZM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}