BibTeX record conf/irps/DoyenYGBFDDFMMPR23

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@inproceedings{DBLP:conf/irps/DoyenYGBFDDFMMPR23,
  author       = {C. Doyen and
                  V. Yon and
                  Xavier Garros and
                  Luigi Basset and
                  Tadeu Mota Frutuoso and
                  C. Dagon and
                  Cheikh Diouf and
                  X. Federspiel and
                  V. Millon and
                  Frederic Monsieur and
                  C. Pribat and
                  David Roy},
  title        = {Insight Into {HCI} Reliability on {I/O} Nitrided Devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117681},
  doi          = {10.1109/IRPS48203.2023.10117681},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/DoyenYGBFDDFMMPR23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}