BibTeX record conf/irps/ChatterjeeOMXT21

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@inproceedings{DBLP:conf/irps/ChatterjeeOMXT21,
  author       = {Neel Chatterjee and
                  John Ortega and
                  Inanc Meric and
                  Peng Xiao and
                  Ilan Tsameret},
  title        = {Machine Learning On Transistor Aging Data: Test Time Reduction and
                  Modeling for Novel Devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405188},
  doi          = {10.1109/IRPS46558.2021.9405188},
  timestamp    = {Fri, 01 Dec 2023 18:16:13 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/ChatterjeeOMXT21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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