BibTeX record conf/irps/ChangLLCMW15

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@inproceedings{DBLP:conf/irps/ChangLLCMW15,
  author       = {M. N. Chang and
                  Y.{-}H. Lee and
                  S. Y. Lee and
                  C. C. Chiu and
                  D. Maji and
                  K. Wu},
  title        = {An investigation of capacitance aging model for extreme low-k and
                  high-k dielectrics},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112700},
  doi          = {10.1109/IRPS.2015.7112700},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ChangLLCMW15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}