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BibTeX record conf/irps/CartierFARN18
@inproceedings{DBLP:conf/irps/CartierFARN18, author = {Eduard Cartier and Martin M. Frank and Takashi Ando and John Rozen and Vijay Narayanan}, title = {{PBTI} in InGaAs {MOS} capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {5}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353604}, doi = {10.1109/IRPS.2018.8353604}, timestamp = {Sat, 30 Sep 2023 09:49:38 +0200}, biburl = {https://dblp.org/rec/conf/irps/CartierFARN18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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