BibTeX record conf/irps/BottiniGVVMM18

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@inproceedings{DBLP:conf/irps/BottiniGVVMM18,
  author       = {Roberta Bottini and
                  Andrea Ghetti and
                  Sara Vigano and
                  Maria Grazia Valentini and
                  Pratap Murali and
                  Chandra Mouli},
  title        = {Non-poissonian behavior of hot carrier degradation induced variability
                  in MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353645},
  doi          = {10.1109/IRPS.2018.8353645},
  timestamp    = {Sun, 02 Oct 2022 16:09:05 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BottiniGVVMM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}