BibTeX record conf/irps/BolshakovRQY19

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@inproceedings{DBLP:conf/irps/BolshakovRQY19,
  author       = {Pavel Bolshakov and
                  Rodolfo A. Rodriguez{-}Davila and
                  Manuel Quevedo{-}Lopez and
                  Chadwin D. Young},
  title        = {Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720547},
  doi          = {10.1109/IRPS.2019.8720547},
  timestamp    = {Sat, 19 Oct 2019 20:31:24 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BolshakovRQY19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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