BibTeX record conf/irps/BiswasLPHGGB24

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@inproceedings{DBLP:conf/irps/BiswasLPHGGB24,
  author       = {Ayan K. Biswas and
                  Daniel J. Lichtenwalner and
                  Jae{-}Hyung Park and
                  Brett Hull and
                  Satyaki Ganguly and
                  Donald A. Gajewski and
                  Elif Balkas},
  title        = {Hole-Induced Threshold Voltage Instability Under High Positive and
                  Negative Gate Stress in SiC MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
                  TX, USA, April 14-18, 2024},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/IRPS48228.2024.10529422},
  doi          = {10.1109/IRPS48228.2024.10529422},
  timestamp    = {Wed, 29 May 2024 21:52:31 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BiswasLPHGGB24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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