BibTeX record conf/irps/BernsteinBB23

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@inproceedings{DBLP:conf/irps/BernsteinBB23,
  author       = {Joseph B. Bernstein and
                  Emmanuel Bender and
                  Alain Bensoussan},
  title        = {The Correct Hot Carrier Degradation Model},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117881},
  doi          = {10.1109/IRPS48203.2023.10117881},
  timestamp    = {Sun, 12 Nov 2023 02:14:38 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/BernsteinBB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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