BibTeX record conf/irps/ArfaouiBMLMCNS20

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@inproceedings{DBLP:conf/irps/ArfaouiBMLMCNS20,
  author       = {Wafa Arfaoui and
                  Germain Bossu and
                  A. Muehlhoff and
                  D. Lipp and
                  R. Manuwald and
                  T. Chen and
                  Tanya Nigam and
                  Mahesh Siddabathula},
  title        = {A Novel {HCI} Reliability Model for RF/mmWave Applications in {FDSOI}
                  Technology},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129479},
  doi          = {10.1109/IRPS45951.2020.9129479},
  timestamp    = {Wed, 05 May 2021 14:14:29 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ArfaouiBMLMCNS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}