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BibTeX record conf/irps/AguirrePPFWE18
@inproceedings{DBLP:conf/irps/AguirrePPFWE18, author = {Fernando L. Aguirre and Sebasti{\'{a}}n Mat{\'{\i}}as Pazos and Felix Palumbo and Sivan Fadida and Roy Winter and Moshe Eizenberg}, title = {Impact of forming gas annealing on the degradation dynamics of Ge-based {MOS} stacks}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {3--1}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353663}, doi = {10.1109/IRPS.2018.8353663}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/AguirrePPFWE18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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