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BibTeX record conf/iri/WangLLCZW22
@inproceedings{DBLP:conf/iri/WangLLCZW22, author = {Xiaoliang Wang and Justin Lowery and Yongjin Lu and Wei{-}bang Chen and Shanshan Zhang and Zhenhua Wu}, title = {Embracing Deep Learning for Crack Segmentation in {SEM} Images of Metal Additive Manufacturing}, booktitle = {23rd {IEEE} International Conference on Information Reuse and Integration for Data Science, {IRI} 2022, San Diego, CA, USA, August 9-11, 2022}, pages = {18--19}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/IRI54793.2022.00017}, doi = {10.1109/IRI54793.2022.00017}, timestamp = {Sat, 30 Sep 2023 09:49:23 +0200}, biburl = {https://dblp.org/rec/conf/iri/WangLLCZW22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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