BibTeX record conf/ipta/Barone20

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@inproceedings{DBLP:conf/ipta/Barone20,
  author       = {Massimiliano Barone},
  title        = {Robust Image Wafer Inspection},
  booktitle    = {Tenth International Conference on Image Processing Theory, Tools and
                  Applications, {IPTA} 2020, Paris, France, November 9-12, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IPTA50016.2020.9286656},
  doi          = {10.1109/IPTA50016.2020.9286656},
  timestamp    = {Thu, 14 Jan 2021 15:14:15 +0100},
  biburl       = {https://dblp.org/rec/conf/ipta/Barone20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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