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BibTeX record conf/ipcv/DongCLF07
@inproceedings{DBLP:conf/ipcv/DongCLF07, author = {Mei Dong and Ronald Chung and Edmund Y. Lam and Kenneth S. M. Fung}, editor = {Hamid R. Arabnia}, title = {Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights}, booktitle = {Proceedings of the 2007 International Conference on Image Processing, Computer Vision, {\&} Pattern Recognition, {IPCV} 2007, June 25-28, 2007, Las Vegas Nevada, {USA}}, pages = {157--163}, publisher = {{CSREA} Press}, year = {2007}, timestamp = {Fri, 04 Jan 2008 10:42:23 +0100}, biburl = {https://dblp.org/rec/conf/ipcv/DongCLF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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