A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST.

Chaowen Yu Sudhakar M. Reddy Irith Pomeranz A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST. 37-42 2006 conf/iolts/2006 IOLTS http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.9 db/conf/iolts/iolts2006.html#YuRP06