BibTeX record conf/iolts/YoshidaKF19

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@inproceedings{DBLP:conf/iolts/YoshidaKF19,
  author       = {Takashi Yoshida and
                  Kazutoshi Kobayashi and
                  Jun Furuta},
  editor       = {Dimitris Gizopoulos and
                  Dan Alexandrescu and
                  Panagiota Papavramidou and
                  Michail Maniatakos},
  title        = {Total Ionizing Dose Effects by alpha irradiation on circuit performance
                  and {SEU} tolerance in thin {BOX} {FDSOI} process},
  booktitle    = {25th {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2019, Rhodes, Greece, July 1-3, 2019},
  pages        = {236--238},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IOLTS.2019.8854439},
  doi          = {10.1109/IOLTS.2019.8854439},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/YoshidaKF19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}