BibTeX record conf/iolts/TebinaMZHM23

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@inproceedings{DBLP:conf/iolts/TebinaMZHM23,
  author       = {Nasr{-}Eddine Ouldei Tebina and
                  Laurent Maingault and
                  Nacer{-}Eddine Zergainoh and
                  Guillaume Hubert and
                  Paolo Maistri},
  editor       = {Alessandro Savino and
                  Michail Maniatakos and
                  Stefano Di Carlo and
                  Dimitris Gizopoulos},
  title        = {Ray-Spect: Local Parametric Degradation for Secure Designs: An application
                  to X-Ray Fault Injection},
  booktitle    = {29th International Symposium on On-Line Testing and Robust System
                  Design, {IOLTS} 2023, Crete, Greece, July 3-5, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IOLTS59296.2023.10224894},
  doi          = {10.1109/IOLTS59296.2023.10224894},
  timestamp    = {Sat, 30 Sep 2023 09:49:09 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/TebinaMZHM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}