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BibTeX record conf/iolts/SfikasT17
@inproceedings{DBLP:conf/iolts/SfikasT17, author = {Yiorgos Sfikas and Yiorgos Tsiatouhas}, title = {Variation tolerant {BTI} monitoring in {SRAM} cells}, booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017}, pages = {100--105}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/IOLTS.2017.8046203}, doi = {10.1109/IOLTS.2017.8046203}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/iolts/SfikasT17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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