BibTeX record conf/iolts/SemiaoFRVSTT09

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@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT09,
  author       = {Jorge Semi{\~{a}}o and
                  Judit Freijedo and
                  Juan J. Rodr{\'{\i}}guez{-}Andina and
                  Fabian Vargas and
                  Marcelino B. Santos and
                  Isabel C. Teixeira and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Delay-fault tolerance to power supply Voltage disturbances analysis
                  in nanometer technologies},
  booktitle    = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
                  24-26 June 2009, Sesimbra-Lisbon, Portugal},
  pages        = {223--228},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/IOLTS.2009.5196020},
  doi          = {10.1109/IOLTS.2009.5196020},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}