BibTeX record conf/iolts/SekyereS022

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@inproceedings{DBLP:conf/iolts/SekyereS022,
  author       = {Michael Sekyere and
                  Marampally Saikiran and
                  Degang Chen},
  editor       = {Alessandro Savino and
                  Paolo Rech and
                  Stefano Di Carlo and
                  Dimitris Gizopoulos},
  title        = {All Digital Low-Cost Built-in Defect Testing Strategy for Operational
                  Amplifiers with High Coverage},
  booktitle    = {28th {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IOLTS56730.2022.9897224},
  doi          = {10.1109/IOLTS56730.2022.9897224},
  timestamp    = {Sat, 30 Sep 2023 09:49:09 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/SekyereS022.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}