BibTeX record conf/iolts/RubioEP17

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@inproceedings{DBLP:conf/iolts/RubioEP17,
  author       = {Antonio Rubio and
                  Manuel Escudero and
                  Peyman Pouyan},
  title        = {Reliability issues in {RRAM} ternary memories affected by variability
                  and aging mechanisms},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {90--92},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046238},
  doi          = {10.1109/IOLTS.2017.8046238},
  timestamp    = {Tue, 11 Jul 2023 16:39:41 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/RubioEP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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