BibTeX record conf/iolts/RondeyTB02

download as .bib file

@inproceedings{DBLP:conf/iolts/RondeyTB02,
  author       = {Emmanuel Rondey and
                  Yann Tellier and
                  Simone Borri},
  title        = {A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs
                  with Different Redundancy Scenarios},
  booktitle    = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
                  8-10 July 2002, Isle of Bendor, France},
  pages        = {251--255},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/OLT.2002.1030227},
  doi          = {10.1109/OLT.2002.1030227},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/RondeyTB02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.