BibTeX record conf/iolts/RechGMLADPR10

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@inproceedings{DBLP:conf/iolts/RechGMLADPR10,
  author       = {Paolo Rech and
                  Michelangelo Grosso and
                  Fabio Melchiori and
                  Domenico Loparco and
                  Davide Appello and
                  Luigi Dilillo and
                  Alessandro Paccagnella and
                  Matteo Sonza Reorda},
  title        = {Analysis of root causes of alpha sensitivity variations on microprocessors
                  manufactured using different cell layouts},
  booktitle    = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
                  5-7 July, 2010, Corfu, Greece},
  pages        = {29--34},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/IOLTS.2010.5560236},
  doi          = {10.1109/IOLTS.2010.5560236},
  timestamp    = {Fri, 28 Apr 2023 13:34:03 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/RechGMLADPR10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}