BibTeX record conf/iolts/OuattaraHS16

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@inproceedings{DBLP:conf/iolts/OuattaraHS16,
  author       = {Boukary Ouattara and
                  Olivier H{\'{e}}ron and
                  Chiara Sandionigi},
  title        = {Fine-grain analysis of the parameters involved in aging of digital
                  circuits},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {51--53},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604671},
  doi          = {10.1109/IOLTS.2016.7604671},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/OuattaraHS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}