BibTeX record conf/iolts/NairBTGT19

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@inproceedings{DBLP:conf/iolts/NairBTGT19,
  author       = {Sarath Mohanachandran Nair and
                  Rajendra Bishnoi and
                  Mehdi Baradaran Tahoori and
                  Hayk T. Grigoryan and
                  Grigor Tshagharyan},
  editor       = {Dimitris Gizopoulos and
                  Dan Alexandrescu and
                  Panagiota Papavramidou and
                  Michail Maniatakos},
  title        = {Variation-aware Fault Modeling and Test Generation for {STT-MRAM}},
  booktitle    = {25th {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2019, Rhodes, Greece, July 1-3, 2019},
  pages        = {80--83},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IOLTS.2019.8854376},
  doi          = {10.1109/IOLTS.2019.8854376},
  timestamp    = {Tue, 31 Aug 2021 17:59:20 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/NairBTGT19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}