BibTeX record conf/iolts/MiuraT21

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@inproceedings{DBLP:conf/iolts/MiuraT21,
  author       = {Yukiya Miura and
                  Shingo Tsutsumi},
  title        = {A Method for Measuring Process Variations in the {FPGA} Chip Considering
                  the Effect of Wire Delay},
  booktitle    = {27th {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2021, Torino, Italy, June 28-30, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IOLTS52814.2021.9486686},
  doi          = {10.1109/IOLTS52814.2021.9486686},
  timestamp    = {Wed, 04 Aug 2021 14:14:35 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/MiuraT21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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