BibTeX record conf/iolts/MakhloufGGKVUWV17

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@inproceedings{DBLP:conf/iolts/MakhloufGGKVUWV17,
  author       = {Mohamed Makhlouf and
                  Diana Goller and
                  Lutz Gendrisch and
                  Stephan Kolnsberg and
                  Franz Vogt and
                  Alexander Utz and
                  Dirk Weiler and
                  Holger Vogt},
  title        = {Automating wafer-level test of uncooled infrared detectors using wafer-prober},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {13--16},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046170},
  doi          = {10.1109/IOLTS.2017.8046170},
  timestamp    = {Tue, 07 May 2024 20:11:45 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/MakhloufGGKVUWV17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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