Ilya Levin Vladimir Sinelnikov Mark G. Karpovsky Sergey Ostanin Sequential Circuits Applicable for Detecting Different Types of Faults. 44- 2002 conf/iolts/2002 IOLTW http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030182 db/conf/iolts/ioltw2002.html#LevinSKO02