@inproceedings{DBLP:conf/iolts/LevinSKO02,
author = {Ilya Levin and
Vladimir Sinelnikov and
Mark G. Karpovsky and
Sergey Ostanin},
title = {Sequential Circuits Applicable for Detecting Different Types
of Faults},
booktitle = {IOLTW},
year = {2002},
pages = {44-},
ee = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030182},
crossref = {DBLP:conf/iolts/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iolts/2002,
title = {8th IEEE International On-Line Testing Workshop (IOLTW 2002),
8-10 July 2002, Isle of Bendor, France},
booktitle = {IOLTW},
publisher = {IEEE Computer Society},
year = {2002},
isbn = {0-7695-1641-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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