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BibTeX record conf/iolts/HobeikaPLTBA14
@inproceedings{DBLP:conf/iolts/HobeikaPLTBA14, author = {Christelle Hobeika and Simon Pichette and M. A. Leonard and Claude Thibeault and Jean{-}Fran{\c{c}}ois Boland and Yves Audet}, title = {Multi-abstraction level signature generation and comparison based on radiation single event upset}, booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS} 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014}, pages = {212--215}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/IOLTS.2014.6873700}, doi = {10.1109/IOLTS.2014.6873700}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/iolts/HobeikaPLTBA14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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