BibTeX
@inproceedings{DBLP:conf/iolts/HanABCE05,
author = {Donghoon Han and
Selim Sermet Akbay and
Soumendu Bhattacharya and
Abhijit Chatterjee and
William R. Eisenstadt},
title = {On-Chip Self-Calibration of RF Circuits Using Specification-Driven
Built-In Self Test (S-BIST)},
booktitle = {IOLTS},
year = {2005},
pages = {106-111},
ee = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.50},
crossref = {DBLP:conf/iolts/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iolts/2005,
title = {11th IEEE International On-Line Testing Symposium (IOLTS
2005), 6-8 July 2005, Saint Raphael, France},
booktitle = {IOLTS},
publisher = {IEEE Computer Society},
year = {2005},
isbn = {0-7695-2406-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-07-03 by Michael Ley (ley@uni-trier.de)