BibTeX record conf/iolts/HanABCE05

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@inproceedings{DBLP:conf/iolts/HanABCE05,
  author       = {Donghoon Han and
                  Selim Sermet Akbay and
                  Soumendu Bhattacharya and
                  Abhijit Chatterjee and
                  William R. Eisenstadt},
  title        = {On-Chip Self-Calibration of {RF} Circuits Using Specification-Driven
                  Built-In Self Test {(S-BIST)}},
  booktitle    = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
                  6-8 July 2005, Saint Raphael, France},
  pages        = {106--111},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/IOLTS.2005.50},
  doi          = {10.1109/IOLTS.2005.50},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/HanABCE05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}