Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor.

Swaroop Ghosh Swarup Bhunia Arijit Raychowdhury Kaushik Roy Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor. 31-36 2006 conf/iolts/2006 IOLTS http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.19 db/conf/iolts/iolts2006.html#GhoshBRR06