BibTeX
@inproceedings{DBLP:conf/iolts/GhoshBRR06,
author = {Swaroop Ghosh and
Swarup Bhunia and
Arijit Raychowdhury and
Kaushik Roy},
title = {Delay Fault Localization in Test-Per-Scan BIST Using Built-In
Delay Sensor},
booktitle = {IOLTS},
year = {2006},
pages = {31-36},
ee = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.19},
crossref = {DBLP:conf/iolts/2006},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iolts/2006,
title = {12th IEEE International On-Line Testing Symposium (IOLTS
2006), 10-12 July 2006, Como, Italy},
booktitle = {IOLTS},
publisher = {IEEE Computer Society},
year = {2006},
isbn = {0-7695-2620-9},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-01-09 by Michael Ley (ley@uni-trier.de)