BibTeX record conf/iolts/GhoshBRR06

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@inproceedings{DBLP:conf/iolts/GhoshBRR06,
  author       = {Swaroop Ghosh and
                  Swarup Bhunia and
                  Arijit Raychowdhury and
                  Kaushik Roy},
  title        = {Delay Fault Localization in Test-Per-Scan {BIST} Using Built-In Delay
                  Sensor},
  booktitle    = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
                  10-12 July 2006, Como, Italy},
  pages        = {31--36},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/IOLTS.2006.19},
  doi          = {10.1109/IOLTS.2006.19},
  timestamp    = {Tue, 07 May 2024 20:11:45 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/GhoshBRR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}