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BibTeX record conf/iolts/FiorucciNDR22
@inproceedings{DBLP:conf/iolts/FiorucciNDR22, author = {Tiziano Fiorucci and Giorgio Di Natale and Jean{-}Marc Daveau and Philippe Roche}, editor = {Alessandro Savino and Paolo Rech and Stefano Di Carlo and Dimitris Gizopoulos}, title = {Software Product Reliability Based on Basic Block Metrics Recomposition}, booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022}, pages = {1--5}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/IOLTS56730.2022.9897289}, doi = {10.1109/IOLTS56730.2022.9897289}, timestamp = {Thu, 06 Oct 2022 15:02:43 +0200}, biburl = {https://dblp.org/rec/conf/iolts/FiorucciNDR22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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