BibTeX record conf/iolts/FiorucciNDR22

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@inproceedings{DBLP:conf/iolts/FiorucciNDR22,
  author       = {Tiziano Fiorucci and
                  Giorgio Di Natale and
                  Jean{-}Marc Daveau and
                  Philippe Roche},
  editor       = {Alessandro Savino and
                  Paolo Rech and
                  Stefano Di Carlo and
                  Dimitris Gizopoulos},
  title        = {Software Product Reliability Based on Basic Block Metrics Recomposition},
  booktitle    = {28th {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IOLTS56730.2022.9897289},
  doi          = {10.1109/IOLTS56730.2022.9897289},
  timestamp    = {Thu, 06 Oct 2022 15:02:43 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/FiorucciNDR22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}