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BibTeX record conf/iolts/Diaz-FortunyMRN18
@inproceedings{DBLP:conf/iolts/Diaz-FortunyMRN18, author = {Javier Diaz{-}Fortuny and Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Rafael Castro{-}L{\'{o}}pez and Elisenda Roca and Francisco V. Fern{\'{a}}ndez}, editor = {Dimitris Gizopoulos and Dan Alexandrescu and Mihalis Maniatakos and Panagiota Papavramidou}, title = {{CMOS} Characterization and Compact Modelling for Circuit Reliability Simulation}, booktitle = {24th {IEEE} International Symposium on On-Line Testing And Robust System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018}, pages = {139--142}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IOLTS.2018.8474244}, doi = {10.1109/IOLTS.2018.8474244}, timestamp = {Sat, 30 Sep 2023 09:49:09 +0200}, biburl = {https://dblp.org/rec/conf/iolts/Diaz-FortunyMRN18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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