BibTeX record conf/iolts/Diaz-FortunyMRN18

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@inproceedings{DBLP:conf/iolts/Diaz-FortunyMRN18,
  author       = {Javier Diaz{-}Fortuny and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Rafael Castro{-}L{\'{o}}pez and
                  Elisenda Roca and
                  Francisco V. Fern{\'{a}}ndez},
  editor       = {Dimitris Gizopoulos and
                  Dan Alexandrescu and
                  Mihalis Maniatakos and
                  Panagiota Papavramidou},
  title        = {{CMOS} Characterization and Compact Modelling for Circuit Reliability
                  Simulation},
  booktitle    = {24th {IEEE} International Symposium on On-Line Testing And Robust
                  System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018},
  pages        = {139--142},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IOLTS.2018.8474244},
  doi          = {10.1109/IOLTS.2018.8474244},
  timestamp    = {Sat, 30 Sep 2023 09:49:09 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/Diaz-FortunyMRN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}