BibTeX record conf/iolts/ChipanaBVSRTT10

• > Home > conf/iolts/ChipanaBVSRTT10

@inproceedings{DBLP:conf/iolts/ChipanaBVSRTT10,
  author       = {Raul Chipana and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas and
                  Jorge Semi{\~{a}}o and
                  Juan J. Rodr{\'{\i}}guez{-}Andina and
                  Isabel C. Teixeira and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Investigating the Use of {BICS} to detect resistive-open defects in
                  SRAMs},
  booktitle    = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
                  5-7 July, 2010, Corfu, Greece},
  pages        = {200--201},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/IOLTS.2010.5560207},
  doi          = {10.1109/IOLTS.2010.5560207},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/ChipanaBVSRTT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}