BibTeX record conf/iolts/BackhausenBBLHK17

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@inproceedings{DBLP:conf/iolts/BackhausenBBLHK17,
  author       = {Ulrich Backhausen and
                  Oscar Ballan and
                  Paolo Bernardi and
                  Sergio de Luca and
                  Julie Henzler and
                  Thomas Kern and
                  Davide Piumatti and
                  Thomas Rabenalt and
                  Krishnapriya Chakiat Ramamoorthy and
                  Ernesto S{\'{a}}nchez and
                  Alessandro Sansonetti and
                  Rudolf Ullmann and
                  Federico Venini and
                  Robert Wiesner},
  title        = {Robustness in automotive electronics: An industrial overview of major
                  concerns},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {157--162},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046234},
  doi          = {10.1109/IOLTS.2017.8046234},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/BackhausenBBLHK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}