AymerichABCCFGHMMPRRVVWZ11'

@inproceedings{DBLP:conf/iolts/AymerichABCCFGHMMPRRVVWZ11,
  author    = {Nivard Aymerich and
               A. Asenov and
               A. Brown and
               Ramon Canal and
               B. Cheng and
               Joan Figueras and
               Antonio Gonz{\'a}lez and
               Enric Herrero and
               S. Markov and
               Miguel Miranda and
               Peyman Pouyan and
               Tanaus{\'u} Ram\'{\i}rez and
               Antonio Rubio and
               I. Vatajelu and
               Xavier Vera and
               X. Wang and
               Paul Zuber},
  title     = {New reliability mechanisms in memory design for sub-22nm
               technologies},
  booktitle = {IOLTS},
  year      = {2011},
  pages     = {111-114},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993820},
  crossref  = {DBLP:conf/iolts/2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/iolts/2011,
  title     = {17th IEEE International On-Line Testing Symposium (IOLTS
               2011), 13-15 July, 2011, Athens, Greece},
  booktitle = {IOLTS},
  publisher = {IEEE},
  year      = {2011},
  isbn      = {978-1-4577-1053-7},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5979170},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}