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BibTeX record conf/iolts/AhlawatTMS16
@inproceedings{DBLP:conf/iolts/AhlawatTMS16, author = {Satyadev Ahlawat and Jaynarayan T. Tudu and Anzhela Yu. Matrosova and Virendra Singh}, title = {A high performance scan flip-flop design for serial and mixed mode scan test}, booktitle = {22nd {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016}, pages = {233--238}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/IOLTS.2016.7604709}, doi = {10.1109/IOLTS.2016.7604709}, timestamp = {Sun, 25 Oct 2020 22:46:51 +0100}, biburl = {https://dblp.org/rec/conf/iolts/AhlawatTMS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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