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BibTeX record conf/iolts/0001JTPS17
@inproceedings{DBLP:conf/iolts/0001JTPS17, author = {Binod Kumar and Ankit Jindal and Jaynarayan T. Tudu and Brajesh Pandey and Virendra Singh}, title = {Revisiting random access scan for effective enhancement of post-silicon observability}, booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017}, pages = {132--137}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/IOLTS.2017.8046208}, doi = {10.1109/IOLTS.2017.8046208}, timestamp = {Sun, 25 Oct 2020 22:46:52 +0100}, biburl = {https://dblp.org/rec/conf/iolts/0001JTPS17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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