BibTeX record conf/indin/ZhangZGYGJZWL020

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@inproceedings{DBLP:conf/indin/ZhangZGYGJZWL020,
  author       = {Qianru Zhang and
                  Meng Zhang and
                  Chinthaka Gamanayake and
                  Chau Yuen and
                  Zehao Geng and
                  Hirunima Jayasekaraand and
                  Xuewen Zhang and
                  Chia{-}wei Woo and
                  Jenny Chen Ni Low and
                  Xiang Liu},
  title        = {Deep Learning Based Defect Detection for Solder Joints on Industrial
                  X-Ray Circuit Board Images},
  booktitle    = {18th {IEEE} International Conference on Industrial Informatics, {INDIN}
                  2020, Warwick, United Kingdom, July 20-23, 2020},
  pages        = {74--79},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/INDIN45582.2020.9442142},
  doi          = {10.1109/INDIN45582.2020.9442142},
  timestamp    = {Wed, 07 Dec 2022 13:34:26 +0100},
  biburl       = {https://dblp.org/rec/conf/indin/ZhangZGYGJZWL020.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}