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BibTeX record conf/indin/ZambalECKM18
@inproceedings{DBLP:conf/indin/ZambalECKM18, author = {Sebastian Zambal and Christian Eitzinger and Michael Clarke and John Klintworth and Pierre{-}Yves Mechin}, title = {A digital twin for composite parts manufacturing : Effects of defects analysis based on manufacturing data}, booktitle = {16th {IEEE} International Conference on Industrial Informatics, {INDIN} 2018, Porto, Portugal, July 18-20, 2018}, pages = {803--808}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/INDIN.2018.8472014}, doi = {10.1109/INDIN.2018.8472014}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/indin/ZambalECKM18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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