BibTeX record conf/indin/SweeneyCK22

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@inproceedings{DBLP:conf/indin/SweeneyCK22,
  author       = {Terence Sweeney and
                  Sonya Coleman and
                  Dermot Kerr},
  title        = {Deep Learning for Semiconductor Defect Classification},
  booktitle    = {20th {IEEE} International Conference on Industrial Informatics, {INDIN}
                  2022, Perth, Australia, July 25-28, 2022},
  pages        = {572--577},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/INDIN51773.2022.9976162},
  doi          = {10.1109/INDIN51773.2022.9976162},
  timestamp    = {Fri, 06 Jan 2023 16:53:16 +0100},
  biburl       = {https://dblp.org/rec/conf/indin/SweeneyCK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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