BibTeX record conf/imw2/ShaoCLDTKSXXW023

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@inproceedings{DBLP:conf/imw2/ShaoCLDTKSXXW023,
  author       = {Xianzhou Shao and
                  Junshuai Chai and
                  Min Liao and
                  Jiahui Duan and
                  Fengbin Tian and
                  Xiaoyu Ke and
                  Xiaoqing Sun and
                  Hao Xu and
                  Jinjuan Xiang and
                  Xiaolei Wang and
                  Wenwu Wang},
  title        = {Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by
                  in-situ Vth Measurement and Endurance Enhancement Strategy},
  booktitle    = {{IEEE} International Memory Workshop, {IMW} 2023, Monterey, CA, USA,
                  May 21-24, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IMW56887.2023.10145966},
  doi          = {10.1109/IMW56887.2023.10145966},
  timestamp    = {Fri, 16 Jun 2023 09:31:14 +0200},
  biburl       = {https://dblp.org/rec/conf/imw2/ShaoCLDTKSXXW023.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}